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Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量

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Horn, Alexander; Wortmann, Dirk; Brand, Andreas; Mingareev, Ilja;
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年度 2010
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正文语种 eng
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1. Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing [J] . Alexander Horn, Dirk Wortmann, Andreas Brand, Applied Physics . 2010,第2期

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量
2. Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing [J] . Alexander Horn, Dirk Wortmann, Andreas Brand, Applied Physics A: Materials Science & Processing . 2010,第2期

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量
3. Effect of alloy composition, stacking fault energy, second phase particles, initial thickness, and measurement position on deformation texture development of nanostructured FCC materials fabricated via accumulative roll bonding process [J] . Roohollah Jamaati, Mohammad Reza Toroghinejad Materials Science and Engineering . 2014,第mara26期

机译：合金成分，堆垛层错能，第二相颗粒，初始厚度和测量位置对通过累积辊压粘合工艺制备的纳米结构FCC材料变形织构发展的影响
4. Optical Phase Measurements During fs-Processing of Materials Using Time-resolved White-light Interferometry [C] . I. Mingareev, D. Wortmann, A. Brand, Conference on Lasers and Electro-Optics Quantum Electronics and Laser Science Conference . 2009

机译：使用时间分辨的白光干涉测量在物料的FS处理期间光学相位测量
5. Time-resolved lattice measurements of shock-induced phase transitions in polycrystalline materials. [D] . Milathianaki, Despina. 2010

机译：时间分辨的晶格测量，用于测量多晶材料中的冲击诱导相变。
6. Development of optical choppers for time-resolved measurements at soft X-ray synchrotron radiation beamlines [O] . Hitoshi Osawa, Takuo Ohkochi, Masami Fujisawa, -1

机译：开发用于软X射线同步加速器辐射束线时间分辨测量的光学斩波器
7. Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing [O] . 2010

机译：开发时间分辨的白光干涉显微镜，用于在fs激光材料加工过程中进行光学相位测量

Development of a time-resolved white-light interference microscope for optical phase measurements during fs-laser material processing

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